Welcome Message from the General Chairs

The advent of the Internet of Things (IoT) has introduced numerous benefits to the industry and community. At the same time, this has raised unique security, privacy, and trust challenges to its enablers and adopters. As the trend in cybersecurity threats continue to grow, it is likely to influence IoT deployments. In particular, the heterogeneous nature of the IoT as well as the computational constraints of many of the building blocks of the IoT make security, privacy and trust an extremely challenging problem to solve. Nonetheless, security, privacy, and trust play a critical role for most, if not all, applications of IoT in domains such as surveillance, healthcare, security, transport, food safety, manufacturing, logistics and supply chain management. Without effective solutions for security, privacy and trust, reliable data fusion and mining, qualified services with context-aware intelligence and enhanced user acceptance and experience cannot be achieved.

The IEEE PERCOM workshop on Security, Privacy and Trust for IoT (SPT-IOT 2019) provides a forum that brings together researchers from academia as well as practitioners from industry, standardization bodies, and government to meet and exchange ideas on recent research and future directions for the IoT with a specific focus on IoT security, privacy, and trust. The novel and state of the art research submitted and presented in the workshop will focus on the communications and network security aspects of IoT and the key enabling technologies for IoT, focusing on some of the IoT applications such as healthcare systems, manufacturing data, IP-based IoT devices, hash functions and blockchain in IoT, addressing some of the challenges to security, privacy and trust and novel approaches to solving these challenges.

The 11 papers that were accepted to be presented at the workshop were carefully chosen after a rigorous review process taking into account their relevance, technical contribution, and novelty. We sincerely thank the members of the Technical Programme Committee (TPC) for their hard work. We also sincerely thank all of the authors for choosing the workshop as an avenue to present their work.

Tanveer Zia, Robin Doss, and Damith C. Ranasinghe

Technical Program Committee